Below the Surface: Sample Preparation and Imaging in the FIB

This session is part of the "Beyond the Scope: CEMAS Discussion Series." Focused Ion Beam instruments have been supporting the semiconductor industry and materials scientists for decades. The creation of the small dual-beam instrument has allowed the expansion of the techniques to cover a wide range of hard and soft materials. The combination of SEM imaging and ion milling is uniquely suited for investigation of the three-dimensional morphology of small features and the preparation of site-specific specimens for transmission electron microscopy. In our brief discussion, we describe the DualBeam FIB capabilities at CEMAS. Then explain their use to study Calcium Fatty Acid deposits in human hair.