Webinar: Exploring Flatlands: Characterizing 2DMaterials with AFM

This webinar discusses the powerful techniques of today’s AFMs for characterizing 2D materials that enable higher resolution, greater sensitivity, and more quantitative results for applications in device manufacturing, energy storage and optoelectronics. Presenters are Dr. Andras Kis, EPFL, and Keith Jones, Applications Scientist, Oxford Instruments Asylum Research