NACK S04: Fabrication and Characterization of Nanostructures Using AFM

2021.04.09 Wesley C. Sanders, Glen Johnson, Salt Lake Community College The atomic force microscope (AFM) is a versatile characterization tool that allows users to acquire high-resolution images of nanoscale surface features. In addition to probing nanoscale surface topography, AFMs can be used to print nanoscale structures using additive and subtractive lithographic techniques. Specialized AFM imaging modes are often required to view nanostructures fabricated using AFM lithography. This talk will provide an overview of AFM lithographic techniques including dip pen nanolithography (DPN), nanoshaving, and electrochemical techniques. This talk will also include a description of specialized AFM imaging modes used to characterize nanostructures printed with AFM. The specialized AFM modes in this talk will include lateral force microscopy (LFM) and phase imaging. A remote access demonstration of AFM lithography and phase imaging will follow. AFM lithography demonstration using contact probe to etch area of polyvinylpyrrolidone (PVP) from glass substrate. After initial area has been etched, a tapping probe will be used to image an expanded area in phase mode, which will show differences in surface stiffness/softness between the PVP and the glass substrate. Table of Contents: 00:00 Fabrication and Characterization of Nanostructures Using AFM 00:21 Welcome 00:33 Welcome 01:24 Fabrication and Characterization of Nanostructures Using AFM 01:57 Penn State 04:21 AFM Lithography 05:36 AFM Operation 07:54 Patterning with AFM 09:08 Self-Assembled Monolayers (SAMs) 11:11 Self-Assembled Monolayers (SAMs) 11:37 Self-Assembled Monolayers (SAMs) 12:17 AFM Lithography 13:01 Nanoshaving 15:14 Nanografting 23:57 Nanoshaving 25:31 Nanoshaving 26:47 AFM Lithography 27:33 Dip – Pen Nanolithography (DPN) 29:59 Dip – Pen Nanolithography (DPN) 33:29 Dip – Pen Nanolithography (DPN) 35:15 Dip – Pen Nanolithography (DPN) 36:44 Dip – Pen Nanolithography (DPN) 38:10 Electrochemical DPN 40:27 Anodization Lithography 42:04 Anodization Lithography 42:23 Anodization Lithography 45:39 Specialized AFM Operating Modes 50:20 Lateral Force Microscopy (LFM) 54:34 LFM – Probe Behavior 55:11 Nanoscale Friction 56:06 LFM – Probe Behavior 56:28 LFM – Photodiode Operation 57:08 LFM – Photodiode Operation 58:03 LFM – Applications 61:00 LFM – Applications 63:37 LFM – Applications 63:52 LFM – Friction Loop 64:13 LFM – Friction Loop 66:09 LFM – Friction Loop 66:22 LFM Calculations 66:43 LFM Calculations 67:10 LFM Calculations – Cantilever Spring Constant 67:26 LFM Calculations – Cantilever Spring Constant 68:30 LFM Calculations 69:17 Specialized AFM Operating Modes 71:18 LFM – Friction Loop 73:18 Tapping Mode 74:25 Resonance Frequency 75:24 Tuning the Cantilever 76:51 Lock-In Amplifiers 77:08 Vibrational/Oscillation Amplitude 77:15 Phase Imaging 78:24 Phase Imaging 79:30 Phase Imaging – Applications 80:54 Thank you! 84:37 Frictional Force Demo 92:18 Nanosurf Naio Demo This presentation and related downloads can be found on nanoHUB.org at: https://nanohub.org/resources/35932