4D STEM Webinar: Ptychography and CoM analysis with Professor Zhen Chen

Join Professor Zhen Chen from the University of Chinese Academy of Sciences as he explores the latest advances in 4D-STEM reconstruction methods, with a focus on electron ptychography, Center of Mass (CoM) analysis, and atomic-resolution imaging. The webinar covers both the theoretical foundations and practical applications of modern 4D-STEM, including multislice ptychography, low-dose imaging, dopant quantification, and next-generation detector technology. ----------------- ⏱️ Chapters: 00:07 Introduction and speaker overview 01:13 Fundamentals of 4D-STEM reconstruction 04:22 Integrated Center of Mass (iCoM) & iDPC imaging 05:43 Electron ptychography fundamentals 08:10 Iterative ptychography reconstruction methods 09:09 Evolution of atomic-resolution ptychography 10:26 Direct electron detectors and EMPAD performance 11:48 Large field-of-view ptychography 12:59 Multislice electron ptychography 15:44 Improving spatial resolution and atomic precision 17:39 Correcting sample mistilt with multislice reconstruction 18:52 Low-dose ptychography for beam-sensitive materials 19:46 Dopant and oxygen vacancy quantification 21:18 Next-generation Arina 4D-STEM detector 23:23 Summary and future of electron ptychography ----------------- In this webinar, you'll learn about: • Fundamentals of 4D-STEM imaging and reconstruction • Integrated Center of Mass (iCoM) and iDPC imaging techniques • Electron ptychography principles and reconstruction workflows • Iterative reconstruction algorithms including ePIE, Difference Map, and Maximum Likelihood • Multislice electron ptychography for thicker specimens • Atomic-resolution imaging beyond conventional STEM limits • Low-dose imaging for beam-sensitive materials • Dopant quantification and oxygen vacancy analysis • Depth sectioning and 3D structural reconstruction • Advantages of direct electron detectors including EMPAD and Arina • Large field-of-view, high-speed 4D-STEM acquisition • Future directions including Ptycho-tomography and in-situ 4D-STEM experiments This webinar is ideal for researchers working in electron microscopy, materials science, semiconductors, functional materials, crystallography, atomic-resolution imaging, and advanced STEM characterization. 🔗 Learn more about Thermo Fisher Scientific Electron Microscopy solutions: https://www.thermofisher.com/electron... ----------------- Keywords & Topics: • 4D-STEM • Electron Ptychography • Center of Mass (CoM) Analysis • Integrated Center of Mass (iCoM) • iDPC Imaging • Multislice Electron Ptychography • Atomic Resolution STEM • EMPAD Detector • Arina Detector • Direct Electron Detection • Dopant Quantification • Oxygen Vacancy Analysis • Functional Materials • Atomic Resolution Imaging • Electron Microscopy Webinar • Professor Zhen Chen • University of Chinese Academy of Sciences • Thermo Fisher Scientific #4DSTEM #Ptychography #ElectronMicroscopy #CenterOfMass #AtomicResolution #MaterialsScience #STEM #ThermoFisher ----------------- Connect with us on social media: Facebook:   / thermofisher   Twitter:   / thermosciemspec   LinkedIn:   / accelerating-microscopy