High-resolution Imaging of Insulating Samples | FIB-SEM & FESEM | ZMCC Live Demo | Episode 10

Join microscopy experts from ZMCC Bay Area as they answer your microscopy questions live. In this episode you will learn how to be able to: Learn how to deal with charging artifacts on insulating samples Quickly and easily achieve charge balance on non-conductive samples without conductive coating Capture high magnification images without charging artifacts ℹ️ 𝗠𝗼𝗿𝗲 𝗶𝗻𝗳𝗼𝗿𝗺𝗮𝘁𝗶𝗼𝗻: 🔬 ZEISS Gemini SEM: https://www.zeiss.com/microscopy/en/p... 🔬 ZMCC Bay Area: https://www.zeiss.com/microscopy/us/l... 🔬 ZEISS Portal: http://www.portal.zeiss.com 🔬 More about our microscopy solutions: http://www.zeiss.com/microscopy 💙 𝗦𝗼𝗰𝗶𝗮𝗹𝘀 Instagram:   / zeiss_microscopy   Linkedin:   / carl-zeiss-microscopy-gmbh   Facebook:   / zeissmicroscopy