Zeiss Sigma HD Scanning Electron Microscope

Zeiss Sigma HD Scanning Electron Microscope Schottky field emission gun (FEG) SEM for high resolution imaging equipped with: variable pressure (VP) capability enabling study of non-conductive material, dedicated low kV BSE detector providing TEM quality backscatter electron images, revealing cellular structures in a wide range of life-science samples, STEM detector with brightfield and darkfield imaging, topographic imaging to ~1nm using an in-lens secondary electron detector, compatible for use with correlative microscopy system, Shuttle and Find, integrated Oxford instrument AZtec EDS and EBSD system, with X-Max 20mm2 SDD EDS detector and high speed Nordlys-F+ EBSD detector. 0:00​ - Start Up & Sample Loading 2:52​ - Stage Movement 3:54​ - Turning on the Beam 4:23​ - Focusing & Working Distance 6:18 - Stigma & Wobble 7:47​ - Capture & Save Images 8:17​ - Shut Down Australian Centre for Microscopy & Microanalysis http://sydney.edu.au/acmm