Nanotalks - New FIB lamella preparation process for in situ TEM

In this Nanotalk, we will present our approach to the lamella sample preparation proces on DENSsolutions's Heating and Heating and Biasing Nano-Chips using our latest FIB stub 3.0. Fore more information about our new FIB stub please visit: https://denssolutions.com/fib-stub-3-0/ Presentation content: 01:47 Introduction 08:23 New FIB stub 3.0 11:10 Sample preparation approach 16:47 Main challenges 21:46 Best practices 31:51 Examples Q&A overview: 37:35 Vijay Bhatia - Sample attachment to stub. 40:20 Elena Macias-Sanchez - Chip compatibility. 46:07 Maria Varela - Mounting the lamella on the chip. 50:00 Justinas Palisaitis - Final sample milling. Follow us on Linkedin:   / dens.  . Follow us on Twitter:   / denssolutions   Subscribe to our newsletter: https://denssolutions.com/newsletter/