Day 2 - Remote Diffraction Acquisition in STEM - Duscher

In this live remote microscope demonstration, the speaker aligns an electron microscope to acquire convergent beam electron diffraction (CBED) patterns on a silicon FIB sample. The session covers practical adjustments like altering the convergence angle, manipulating the High-Angle Annular Dark Field (HAADF) detector, and navigating reciprocal space to prepare for 4D STEM analysis.