Mind the Bandgap: Cathodoluminescence Imaging and Spectroscopy in the SEM

In the SEM, the electron beam causes materials to fluoresce (Cathodoluminescence, CL) as excited electrons relax back to the ground state. From this fluorescent emission profile, information can be obtained about the properties and defects/impurities in a material down to the nanometer range. This information can be correlated to the morphology and other material properties observable simultaneously in the SEM. In this webinar, we discuss the basics of CL along with applications from disciplines including semiconductor materials, geological samples, components in pharmaceuticals, and materials as labels for biological applications.