Перейти к содержимому

Scanning Electron Microscopy (SEM) | Principle, Working, Instrumentation, EDS & Applications |

Aashish Modi

0:00 / 0:00

Scanning Electron Microscopy (SEM) | Principle, Working, Instrumentation, EDS & Applications |

187 просмотров · 6 дней назад
Aashish Modi
34 подписчика
187 просмотров · 6 дней назад
🔬 Scanning Electron Microscopy (SEM) – Complete Lecture in Hinglish Is video mein hum Scanning Electron Microscopy (SEM) ko basic se advanced level tak easy Hinglish mein samjhenge. Is lecture mein cover kiya gaya hai: ✅ SEM kya hai aur iska basic principle ✅ Electron Gun aur Electron Beam ✅ Electromagnetic Lenses ✅ Scanning System ✅ Electron–Sample Interaction ✅ Secondary Electrons (SE) ✅ Backscattered Electrons (BSE) ✅ X-ray Generation ✅ EDS/EDX Elemental Analysis ✅ Sample Preparation & Sputter Coating ✅ Vacuum System ✅ Working Distance & Accelerating Voltage ✅ Magnification & Resolution ✅ SEM Image Analysis ✅ SEM ke Advantages & Limitations ✅ Nanomaterials, Biochar, Catalyst, Polymer & Materials Research mein Applications ✅ SEM ko XRD, FTIR aur BET ke saath kaise use karein 🎓 Useful for: B.Sc., M.Sc., B.Tech, M.Tech, PhD Scholars, Chemical Engineering, Materials Science, Nanotechnology aur Research Students. Agar aap SEM ko research aur practical characterization ke perspective se samajhna chahte hain, to ye complete lecture aapke liye useful hai. 👍 Video pasand aaye to Like, Share & Subscribe karein aur 🔔 Bell Icon press karein. #SEM #ScanningElectronMicroscopy #Nanotechnology #MaterialsScience