Semiconductor Reliability

This presentation is an introduction to many of the reliability issues encountered when designing and manufacturing Integrated Circuits such as ESD, Latchup, Electromigration, antenna diodes, reactive ion etching, hot electrons, impact ionization, NBTI, PBTI, HTOL, HAST, EOS, SETs, and the Purple Plague. 00:00 Intro 01:54 ESD 21:21 Latchup 26:50 Electromigration 34:48 Antenna Diodes 38:37 PBTI & NBTI 42:47 Hot Electrons 49:41 Qualification Testing 51:27 Package Issues 54:51 Conclusions 55:54 Glossary