High-Speed Optical Metrology for MicroLED Displays, Arrays & Wafers | MicroLED Connect 2026

In this talk from MicroLED Connect 2026, Dr. Tobias Steinel presents high-speed optical metrology for MicroLED displays, wafers and CPO / optical interconnect applications. Key topics include 70 Hz fully calibrated imaging, GPU-accelerated analysis, pixel- and emitter-level correction, spectral calibration, observer metamerism, color-matching functions, VCSEL / optical interconnect testing and production-scale measurement. The high-frame-rate approach can improve measurement speed by up to a factor of 100. ▸ Learn more about our MicroLED measurement solutions: https://www.instrumentsystems.com/en/... ▸ Learn more about Instrument Systems: https://www.instrumentsystems.com/ #MicroLED #CPO #OpticalInterconnect #HighSpeedImaging #DisplayMetrology #VCSEL #Photonics #InstrumentSystems