High Accuracy Optical Metrology for MicroLED Displays and Wafers

From wafer to display: How optical metrology improves the efficiency of MicroLED manufacturing Dr. Tobias Steinel (MicroLED Connect 2025) presents traceable testing methods using electroluminescence (EL) and photoluminescence (PL). Discover how imaging systems from Instrument Systems deliver fast, reliable results — from single MicroLEDs to full wafers. ▸ Traceable MicroLED testing with optical metrology ▸ Electroluminescence and photoluminescence measurement methods ▸ High-speed imaging for wafer and display inspection Learn more at: https://www.instrumentsystems.com/en/... #MicroLED #WaferTesting #OpticalMetrology #DisplayTesting #InstrumentSystems