Theoretical introduction to 4D STEM with Professor Roberto dos Reis

Gain a comprehensive introduction to 4D Scanning Transmission Electron Microscopy (4D-STEM) with Professor Roberto dos Reis of Northwestern University. This webinar provides the theoretical foundation for 4D-STEM, covering STEM imaging principles, electron diffraction, detector technologies, beam optimization, data acquisition strategies, dose management, and large-scale data processing. It serves as the foundation for the Thermo Fisher Scientific 4D-STEM webinar series, preparing researchers to design, acquire, and analyze high-quality 4D-STEM experiments. ----------------- ⏱️ Chapters: 00:07 Welcome and speaker introduction 01:19 Webinar goals and learning outcomes 02:45 STEM fundamentals and electron diffraction 04:28 STEM image contrast mechanisms 05:04 Introduction to 4D-STEM 06:28 Real space and reciprocal space in 4D-STEM 07:33 Electron beam parameters and convergence angle 10:07 Applications of convergent beam electron diffraction (CBED) 12:10 Electron dose and beam-sensitive materials 16:32 Scanning strategies and sampling methods 19:01 Detector technologies for 4D-STEM 21:28 Managing large 4D-STEM datasets 25:41 Closing remarks ----------------- In this webinar, you'll learn how to: • Understand the theoretical foundations of 4D-STEM • Differentiate between real-space and reciprocal-space information • Configure electron beam parameters and convergence angle for different experiments • Select appropriate scanning strategies for high-resolution and large-area imaging • Optimize electron dose for beam-sensitive materials • Understand the role of Bright Field (BF), Annular Dark Field (ADF), and diffraction-based imaging • Compare scintillator-based and direct electron detectors for 4D-STEM acquisition • Design experiments for strain mapping, crystallography, defect analysis, orientation mapping, and phase characterization • Manage, process, and store large multidimensional 4D-STEM datasets efficiently • Apply best practices for detector configuration, data acquisition, and computational analysis This theoretical introduction is ideal for researchers beginning with 4D-STEM, providing the knowledge needed to prepare for practical data acquisition, ptychography, Center of Mass (CoM) imaging, strain mapping, and advanced electron microscopy workflows. 🔗 Learn more about Thermo Fisher Scientific Electron Microscopy solutions: https://www.thermofisher.com/electron... ----------------- Keywords & Topics: • 4D-STEM • Scanning Transmission Electron Microscopy • Professor Roberto dos Reis • Northwestern University • Electron Diffraction • Convergent Beam Electron Diffraction (CBED) • STEM Imaging • Direct Electron Detectors • Electron Dose Optimization • Strain Mapping • Orientation Mapping • Crystallography • Diffraction Analysis • Electron Microscopy • Materials Science • Thermo Fisher Scientific #4DSTEM #ElectronMicroscopy #STEM #MaterialsScience #ElectronDiffraction #CBED #DirectElectronDetectors #ThermoFisher ----------------- Connect with us on social media: Facebook:   / thermofisher   Twitter:   / thermosciemspec   LinkedIn:   / accelerating-microscopy